The latest white paper from METTLER TOLEDO on advanced Process Analytical Technology (PAT) entitled "New Technologies for Advanced Crystallization Development" explores in situ monitoring technologies and how these tools are helping researchers achieve the results they need to compete in today's marketplace.

Greifensee, Zurich -- (SBWire) -- 12/19/2011 --METTER TOLEDO is pleased to announce publication of a new white paper entitled "New Technologies for Advanced Crystallization Development." This latest installment in its library to tackle crystallization and precipitation processesexplores how best practices using Process Analytical Technology (PAT) improve batch purity, yield and repeatability for heightened accuracy, easier scale-up, and lower production costs.

The paper reviews how PAT technologies such as METTLER TOLEDO EasyMax, OptiMax and ReactIR allow chemists to achieve a quick and thorough understanding of reaction parameters such as temperature, solvent use, seeding and nucleation. It examines various production scenarios where these technologies are used to control crystallization-including pipeline production where supersaturation is high and offline sampling impossible. In each scenario, in situ monitoring is shown to provide significant advantages to offline sampling or crashing out solids, especially when time is of the essence and accuracy is critical.

The paper also explores how these robust technologies also allow full Design of Experiment (DoE) cycles, even in today's very short production timelines, through optimized workstation layout and usability. Practical and consistent DoE application helps eliminate impurities that harm crystal development and particle parameter inconsistencies that are difficult to accommodate downstream.

For a more complete discussion of the benefits of using advanced PAT to support crystallization best practices, download the free white paper at: http://us.mt.com/us/en/home/supportive_content/White_Papers.crystallizati2.oneColEd.html